JPH0170170U - - Google Patents
Info
- Publication number
- JPH0170170U JPH0170170U JP1987118426U JP11842687U JPH0170170U JP H0170170 U JPH0170170 U JP H0170170U JP 1987118426 U JP1987118426 U JP 1987118426U JP 11842687 U JP11842687 U JP 11842687U JP H0170170 U JPH0170170 U JP H0170170U
- Authority
- JP
- Japan
- Prior art keywords
- integrated circuit
- test head
- circuit testing
- support part
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987118426U JP2511186Y2 (ja) | 1987-07-31 | 1987-07-31 | 集積回路試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987118426U JP2511186Y2 (ja) | 1987-07-31 | 1987-07-31 | 集積回路試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0170170U true JPH0170170U (en]) | 1989-05-10 |
| JP2511186Y2 JP2511186Y2 (ja) | 1996-09-18 |
Family
ID=31362774
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987118426U Expired - Lifetime JP2511186Y2 (ja) | 1987-07-31 | 1987-07-31 | 集積回路試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2511186Y2 (en]) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPWO2006129372A1 (ja) * | 2005-06-03 | 2008-12-25 | 株式会社アドバンテスト | 半導体試験装置 |
| JP2024152869A (ja) * | 2020-11-20 | 2024-10-25 | 株式会社東京精密 | マルチプローバ |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6178135A (ja) * | 1984-09-25 | 1986-04-21 | Mitsubishi Electric Corp | 半導体ウエ−ハの測定装置 |
| JPS6230952A (ja) * | 1985-08-01 | 1987-02-09 | Kawasaki Steel Corp | 可搬式の鋼板自動超音波探傷装置 |
-
1987
- 1987-07-31 JP JP1987118426U patent/JP2511186Y2/ja not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6178135A (ja) * | 1984-09-25 | 1986-04-21 | Mitsubishi Electric Corp | 半導体ウエ−ハの測定装置 |
| JPS6230952A (ja) * | 1985-08-01 | 1987-02-09 | Kawasaki Steel Corp | 可搬式の鋼板自動超音波探傷装置 |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPWO2006129372A1 (ja) * | 2005-06-03 | 2008-12-25 | 株式会社アドバンテスト | 半導体試験装置 |
| JP2024152869A (ja) * | 2020-11-20 | 2024-10-25 | 株式会社東京精密 | マルチプローバ |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2511186Y2 (ja) | 1996-09-18 |